thickness by reflection

The influence of the thickness deviation on the reflection spectrum of semiconductor materials DBR was analyzed using the transfer matrix method. By the influence, a determining method of the thickness of the DBR grown by MOCVD was presented.

应用传输矩阵方法分析了厚度偏差对半导体布拉格反射镜（DBR）反射谱的影响，并利用这种影响提出了一种金属有机化合物汽相淀积（MOCVD）制备布拉格反射镜精确确定外延厚度的方法。

In the case of multiple-reservoir series whose vertical thickness is less than the tuning thickness, the multiple-reset-voir series can also be considered as a single thin bed, and its total thickness can also be determined by the composition reflection ampli-tude.

在多层储集层的情况下，只要其垂向分布范围在调谐厚度以内，应象单个薄层一样，也能利用复合反射波振幅求得多层储集层的总厚度。

When a thin interbed is thicker than 0. 2m, the upper and down interfaces generate two groups of reflection waves, by which both the bed thickness and reservoir characteristic may be known.

当薄层厚度大于0.2m时，在上、下层界面处会出现两组反射液，利用反射波信息可分辨出薄层厚度，评价其储集特性；